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[Qemu-devel] [Bug 1798780] [NEW] hw/usb/dev-mtp.c:1616: bad test ?
From: |
dcb |
Subject: |
[Qemu-devel] [Bug 1798780] [NEW] hw/usb/dev-mtp.c:1616: bad test ? |
Date: |
Fri, 19 Oct 2018 09:07:40 -0000 |
Public bug reported:
hw/usb/dev-mtp.c:1616:52: warning: logical ‘or’ of collectively
exhaustive tests is always true [-Wlogical-op]
Source code is
if ((ret == -1) && (errno != EINTR || errno != EAGAIN ||
errno != EWOULDBLOCK)) {
Maybe better code
if ((ret == -1) && (errno != EINTR && errno != EAGAIN &&
errno != EWOULDBLOCK)) {
** Affects: qemu
Importance: Undecided
Status: New
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https://bugs.launchpad.net/bugs/1798780
Title:
hw/usb/dev-mtp.c:1616: bad test ?
Status in QEMU:
New
Bug description:
hw/usb/dev-mtp.c:1616:52: warning: logical ‘or’ of collectively
exhaustive tests is always true [-Wlogical-op]
Source code is
if ((ret == -1) && (errno != EINTR || errno != EAGAIN ||
errno != EWOULDBLOCK)) {
Maybe better code
if ((ret == -1) && (errno != EINTR && errno != EAGAIN &&
errno != EWOULDBLOCK)) {
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