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[RFC PATCH v2 3/5] tests/tcg/ppc64le: drop __int128 usage in bcdsub
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From: |
matheus . ferst |
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Subject: |
[RFC PATCH v2 3/5] tests/tcg/ppc64le: drop __int128 usage in bcdsub |
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Date: |
Thu, 3 Mar 2022 14:20:39 -0300 |
From: Matheus Ferst <matheus.ferst@eldorado.org.br>
Using __int128 with inline asm constraints like "v" generates incorrect
code when compiling with LLVM/Clang (e.g., only one doubleword of the
VSR is loaded). Instead, use a GPR pair to pass the 128-bits value and
load the VSR with mtvsrd/xxmrghd.
Signed-off-by: Matheus Ferst <matheus.ferst@eldorado.org.br>
---
I'm avoiding newer insns like mtvsrdd/mfvsrld to move values between VSR
and GPR so we can run this test in a POWER8 machine.
v2:
- No vector types to avoid endian-dependent code.
---
tests/tcg/ppc64le/bcdsub.c | 117 +++++++++++++++++--------------------
1 file changed, 53 insertions(+), 64 deletions(-)
diff --git a/tests/tcg/ppc64le/bcdsub.c b/tests/tcg/ppc64le/bcdsub.c
index 8c188cae6d..c9ca5357cb 100644
--- a/tests/tcg/ppc64le/bcdsub.c
+++ b/tests/tcg/ppc64le/bcdsub.c
@@ -1,6 +1,7 @@
#include <assert.h>
#include <unistd.h>
#include <signal.h>
+#include <stdint.h>
#define CRF_LT (1 << 3)
#define CRF_GT (1 << 2)
@@ -8,21 +9,32 @@
#define CRF_SO (1 << 0)
#define UNDEF 0
-#define BCDSUB(vra, vrb, ps) \
- asm ("bcdsub. %1,%2,%3,%4;" \
- "mfocrf %0,0b10;" \
- : "=r" (cr), "=v" (vrt) \
- : "v" (vra), "v" (vrb), "i" (ps) \
- : );
+#define BCDSUB(AH, AL, BH, BL, PS) \
+ asm ("mtvsrd 32, %3\n\t" \
+ "mtvsrd 33, %4\n\t" \
+ "xxmrghd 32, 32, 33\n\t" \
+ "mtvsrd 33, %5\n\t" \
+ "mtvsrd 34, %6\n\t" \
+ "xxmrghd 33, 33, 34\n\t" \
+ "bcdsub. 0, 0, 1, %7\n\t" \
+ "mfocrf %0, 0b10\n\t" \
+ "mfvsrd %1, 32\n\t" \
+ "xxswapd 32, 32\n\t" \
+ "mfvsrd %2, 32\n\t" \
+ : "=r" (cr), "=r" (th), "=r" (tl) \
+ : "r" (AH), "r" (AL), "r" (BH), "r" (BL), "i" (PS) \
+ : "v0", "v1", "v2");
-#define TEST(vra, vrb, ps, exp_res, exp_cr6) \
+#define TEST(AH, AL, BH, BL, PS, TH, TL, CR6) \
do { \
- __int128 vrt = 0; \
int cr = 0; \
- BCDSUB(vra, vrb, ps); \
- if (exp_res) \
- assert(vrt == exp_res); \
- assert((cr >> 4) == exp_cr6); \
+ uint64_t th, tl; \
+ BCDSUB(AH, AL, BH, BL, PS); \
+ if (TH || TL) { \
+ assert(tl == TL); \
+ assert(th == TH); \
+ } \
+ assert((cr >> 4) == CR6); \
} while (0)
@@ -33,13 +45,13 @@
*/
void test_bcdsub_eq(void)
{
- __int128 a, b;
-
/* maximum positive BCD value */
- a = b = (((__int128) 0x9999999999999999) << 64 | 0x999999999999999c);
-
- TEST(a, b, 0, 0xc, CRF_EQ);
- TEST(a, b, 1, 0xf, CRF_EQ);
+ TEST(0x9999999999999999, 0x999999999999999c,
+ 0x9999999999999999, 0x999999999999999c,
+ 0, 0x0, 0xc, CRF_EQ);
+ TEST(0x9999999999999999, 0x999999999999999c,
+ 0x9999999999999999, 0x999999999999999c,
+ 1, 0x0, 0xf, CRF_EQ);
}
/*
@@ -49,21 +61,16 @@ void test_bcdsub_eq(void)
*/
void test_bcdsub_gt(void)
{
- __int128 a, b, c;
+ /* maximum positive and negative one BCD values */
+ TEST(0x9999999999999999, 0x999999999999999c, 0x0, 0x1d, 0,
+ 0x0, 0xc, (CRF_GT | CRF_SO));
+ TEST(0x9999999999999999, 0x999999999999999c, 0x0, 0x1d, 1,
+ 0x0, 0xf, (CRF_GT | CRF_SO));
- /* maximum positive BCD value */
- a = (((__int128) 0x9999999999999999) << 64 | 0x999999999999999c);
-
- /* negative one BCD value */
- b = (__int128) 0x1d;
-
- TEST(a, b, 0, 0xc, (CRF_GT | CRF_SO));
- TEST(a, b, 1, 0xf, (CRF_GT | CRF_SO));
-
- c = (((__int128) 0x9999999999999999) << 64 | 0x999999999999998c);
-
- TEST(c, b, 0, a, CRF_GT);
- TEST(c, b, 1, (a | 0x3), CRF_GT);
+ TEST(0x9999999999999999, 0x999999999999998c, 0x0, 0x1d, 0,
+ 0x9999999999999999, 0x999999999999999c, CRF_GT);
+ TEST(0x9999999999999999, 0x999999999999998c, 0x0, 0x1d, 1,
+ 0x9999999999999999, 0x999999999999999f, CRF_GT);
}
/*
@@ -73,45 +80,27 @@ void test_bcdsub_gt(void)
*/
void test_bcdsub_lt(void)
{
- __int128 a, b;
+ /* positive zero and positive one BCD values */
+ TEST(0x0, 0xc, 0x0, 0x1c, 0, 0x0, 0x1d, CRF_LT);
+ TEST(0x0, 0xc, 0x0, 0x1c, 1, 0x0, 0x1d, CRF_LT);
- /* positive zero BCD value */
- a = (__int128) 0xc;
-
- /* positive one BCD value */
- b = (__int128) 0x1c;
-
- TEST(a, b, 0, 0x1d, CRF_LT);
- TEST(a, b, 1, 0x1d, CRF_LT);
-
- /* maximum negative BCD value */
- a = (((__int128) 0x9999999999999999) << 64 | 0x999999999999999d);
-
- /* positive one BCD value */
- b = (__int128) 0x1c;
-
- TEST(a, b, 0, 0xd, (CRF_LT | CRF_SO));
- TEST(a, b, 1, 0xd, (CRF_LT | CRF_SO));
+ /* maximum negative and positive one BCD values */
+ TEST(0x9999999999999999, 0x999999999999999d, 0x0, 0x1c, 0,
+ 0x0, 0xd, (CRF_LT | CRF_SO));
+ TEST(0x9999999999999999, 0x999999999999999d, 0x0, 0x1c, 1,
+ 0x0, 0xd, (CRF_LT | CRF_SO));
}
void test_bcdsub_invalid(void)
{
- __int128 a, b;
+ TEST(0x0, 0x1c, 0x0, 0xf00, 0, UNDEF, UNDEF, CRF_SO);
+ TEST(0x0, 0x1c, 0x0, 0xf00, 1, UNDEF, UNDEF, CRF_SO);
- /* positive one BCD value */
- a = (__int128) 0x1c;
- b = 0xf00;
+ TEST(0x0, 0xf00, 0x0, 0x1c, 0, UNDEF, UNDEF, CRF_SO);
+ TEST(0x0, 0xf00, 0x0, 0x1c, 1, UNDEF, UNDEF, CRF_SO);
- TEST(a, b, 0, UNDEF, CRF_SO);
- TEST(a, b, 1, UNDEF, CRF_SO);
-
- TEST(b, a, 0, UNDEF, CRF_SO);
- TEST(b, a, 1, UNDEF, CRF_SO);
-
- a = 0xbad;
-
- TEST(a, b, 0, UNDEF, CRF_SO);
- TEST(a, b, 1, UNDEF, CRF_SO);
+ TEST(0x0, 0xbad, 0x0, 0xf00, 0, UNDEF, UNDEF, CRF_SO);
+ TEST(0x0, 0xbad, 0x0, 0xf00, 1, UNDEF, UNDEF, CRF_SO);
}
int main(void)
--
2.25.1