Re: [PATCH v21 8/9] migration-test: Export migration-test util funtions

[Peter Xu]

On Wed, Mar 16, 2022 at 09:07:20PM +0800, huangy81@chinatelecom.cn wrote:
> +void wait_for_serial(const char *tmpfs, const char *side)

Passing over tmpfs over and over (even if it's mostly a constant) doesn't
sound appealing to me..

I hope there's still a way that we could avoid doing that when spliting the
file.  Or, how about you just add a new test into migration-test?  After
all all migration tests (including auto-converge) is there, and I don't
strongly feel that we need a separate file urgently.

Thanks,

-- 
Peter Xu